Oneof our customers has been honoured by a Queen's Award for Enterprise for a second time. They make high throughput, end of production line test equipment for discrete semiconductors. In order to cope with a range of devices in three to six pin SOT-23 packages, we designed a smart scanner for them. This allows the generators in the main chassis to be multiplexed to any of the pins on the device. The control board pictured above includes additional force and measure functions for new high speed thermal tests and to excite additional device pins. The board includes the address decoding and drivers for the matrix relays.